Laboratory for Nanoscopies and Spectroscopies-LANE

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The LANE laboratory has a TEM field emission microscope Tecnai F30, equipped with STEM mode, EDX and HAADF detectors, and an energy filter analyzer (GIF). In addition sample preparation equipment is available including plasma cleaning, surface polishing and thin films fabrication. The techniques available include: bright and dark field TEM; high resolution TEM; electron diffraction; STEM-HAADF analysis; EDX and STEM-EDX as well as EELS and STEM-EELS analysis (including point and line measurements and compositional maps); EFTEM images; spectrum-image and electron tomography analysis. More details about the LANE laboratory can be found on the website http://www.lane.icmse.csic.es/ (under construction).These facilities offer microstructural and chemical characterization especially devoted to the areas of materials science and physical chemistry of the solid state. It is relevant the high resolution analytical microscopy to characterize materials in the nano-scale..

Available Equipment

• Microscopio Tecnai G2 F30 S-TWIN 300KV con pistola de emisión de campo. Resolución estructural de 0,2 nm entre puntos, portamuestras de uno y dos ángulos. Adjuntos al equipo hay un detector de derivación de silicio EDX X-Max 80T Detector (Oxford Instruments) y un filtro de energía Gatan (GIF Quantum SE)
• Additional equipment in the “electron microscopy samples preparation laboratory”