X-Ray Diffraction Laboratory

X-ray diffraction allows the qualitative and quantitative identification of crystalline substances and their microstructural and textural characterization.
At present, four independent diffractometers are available in this service, specifically config-ured to analyze the composition, chemical stability, crystallinity and many other properties in polycrystalline samples of a varied nature. Besides ordinary analyses (Θ-2Θ), part of the equipment can perform some advanced studies as:

• Direct monitoring of transformations undergone in materials under heating, such as phase changes, under inert o reactive atmosphere.
• To characterize materials at the nanoscale (1-100 nm) through X-ray scattering at low angles, using the SAXS technique.
• To measure some physical parameters of layers such as density, thickness and surface rough-ness with the reflectometry setup.
• To obtain the diffraction patterns of samples either sensitive to the atmosphere or highly transparent to X-rays (organic compounds) employing the capillary configuration.

Available Equipment

• Diffractometer PANALYTICAL X’PERT PRO with automatic sample charger
• Diffractometer PHILIPS X’PERT with high temperature chamber (1200ºC) ANTON PAAR HTK 1200
• Diffractometer PANALYTICAL X’PERT PRO (reflectometry, SAXS, low angle scattering and capillary)